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Leeb Hardness Tester C Type Impact Device for Smaller Thin Compone NDT Test

Name: Leeb Hardness Tester C Type Impact Device for Smaller Thin Compone NDT Test
SKU: 167759468206
Price: 179.51 USD
Availability: InStock

$89.76

$179.51 -50%

Brand VTSYIQI

Condition New

Item ID 167759468206

Country of Origin	China
Brand	VTSYIQI
Type	Impact Device
MPN	Impact Device
UPC	658359888741

Check the listing for details. Leeb Hardness Tester C Type Impact Device for Smaller Thin Compone NDT Test. Condition: New, Made in China. Listed at 179.51 USD. C : Test small, light, thin parts and surface of hardened layer. Item model number ‏ : ‎ C type impact device. Available type of impact device.

$89.76

$179.51

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