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SEM Test Calibration Sample - FEI Part 4022 262 37681 System Test

Name: SEM Test Calibration Sample - FEI Part 4022 262 37681 System Test
SKU: 287479868556
Price: 2200.00 USD
Availability: InStock

$1,100.00

$2,200.00 -50%

Brand FEI

Condition New

Item ID 287479868556

Brand	FEI
Microscope Type	Scanning Electron Microscope (SEM)
MPN	402226237681

Check the listing for details. SEM Test Calibration Sample - FEI Part 4022 262 37681 System Test. Condition: New. Listed at 2200.00 USD. Brand new, never used, FEI system test sample. Part # 4022 262 37681 (has been replaced with 4035 273 15051). $3400 from FEI (now Thermo Fisher Scientific). Contains a wide variety of samples for system verification.

$1,100.00

$2,200.00

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